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Advanced Tools for Testing, Measurement, and Industrial Instrumentation

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DS2210A

Software

Detect, localize, and mitigate side-channel leakage before tape-out. Inspector SC2 Pre-Silicon Side-Channel Analysis enables hardware security, design, and verification teams to identify side-channel vulnerabilities during design phase and development, before silicon is manufactured (pre-silicon). While traditional post-silicon testing can determine whether leakage exists in a fabricated device, Inspector provides visibility into where leakage originates within the design, helping teams identify the root cause and evaluate mitigation strategies earlier in the development lifecycle. By analyzing register-transfer level (RTL), synthesized netlist, and gate-level designs using simulation test vectors and Value Change Dump (VCD) files, Inspector SC2 Pre-Silicon Side-Channel Analysis identifies which signals leak, how much they leak, when leakage occurs, and where it originates within the design. This visibility enables teams to validate countermeasures, compare design alternatives, and reduce the cost and risk of discovering vulnerabilities after fabrication.

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B2200A

Low-Leakage Switch Matrix

B2200A fA leakage switch mainframe reduces the cost of test by enabling automatic characterization tests without compromising the measurement performance.

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B2201A

Low-Leakage Switch Matrix

The Keysight B2201A low leakage switch mainframe reduces the cost of test through characterization test automation.

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E5250A

Low-Leakage Switch Matrix

The E5250A Low-leakage Switch Mainframe provides plug-in modules to integrate CV-IV measurements with an automated measurement system for long-term reliability tests.

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E9902G

In-Circuit Test Systems

The E9902G supports 2592 nodes, Series 6 executes Silicon Nails and Boundary-Scan up to 4x faster, while the overall physical footprint is 16% smaller than before.

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E9903G

In-Circuit Test Systems

The E9903G 4-Module In-Circuit Test (ICT) System supports up to 5184 nodes, Series 6 executes digital testing up to 4x faster while the overall physical footprint is 38% smaller.

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E9905G

In-Circuit Test Systems

Keysight’s E9905G supports up to 2592 nodes, Series 6 executes digital testing up to 4x faster while the overall physical footprint is 38% smaller.

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E9986E

In-Circuit Test Systems

The E9988E Keysight Medalist i3070 Series 5i Inline In-Circuit Test (ICT) system brings ICT technologies into your automated manufacturing line.

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E9988E

In-Circuit Test Systems

The E9988E Keysight Medalist i3070 Series 5i Inline In-Circuit Test (ICT) system brings ICT technologies into your automated manufacturing line.

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