The E9988E Keysight Medalist i3070 Series 5i Inline In-Circuit Test (ICT) system brings ICT technologies into your automated manufacturing line.
| Fixture actuation | Press down |
| Maximum node count | 5184 |
| System width | 1800 mm |
| Maximum parallel testing | 4 |
Detects a wide range of structural defects, such as solder opens, shorts, and incorrect component placement, ensuring improved product quality and reduced rework costs.
Supports high-density boards with flexible pin-count configurations, allowing adaptation to various board sizes and complexities without changing hardware.
Provides real-time test metrics, deep data insights, and automated reporting directly on the tester. Enables faster root-cause analysis, improves productivity on complex boards, and supports seamless scaling to enterprise-level analytics.
Performs structural diagnostics through standard test access ports (TAPs), eliminating the need for intrusive probing or additional hardware instrumentation.
| System width | 800 mm to 1800 mm |
| Maximum node count | Maximum parallel testing |
| Fixture actuation | Vacuum, Press down |
The E9988E Keysight Medalist i3070 Series 5i Inline In-Circuit Test (ICT) system brings ICT technologies into your automated manufacturing line.
Short-wire fixturing technology ensures transportability, repeatability and stability
Innovate at speed with curated support plans and prioritized response and turn-around times.
Get predictable, lease-based subscriptions and full lifecycle management solutions—so you reach your business goals faster.
Experience elevated service as a KeysightCare subscriber to get committed technical response and more.
Ensure your test system performs to specification and meets local and global standards.
Make measurements quickly with in-house, instructor-led training, and eLearning.
Download Keysight software or update your software to the newest version.
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