The E5250A Low-leakage Switch Mainframe provides plug-in modules to integrate CV-IV measurements with an automated measurement system for long-term reliability tests.
| Maximum output ports | 96 |
| Isolation | 10 TΩ |
| Type | Matrix or Multiplexer |
| Minimum current measurement resolution | 20 fA |
Maintain the integrity of ultra-low current measurements with switch paths designed to minimize leakage, ideal for precision measurements in advanced semiconductor materials.
Accommodate complex test configurations with scalable channel counts up to 48 outputs, supporting multi-pin devices and automated test matrices in wafer-level setups.
Ensure accuracy in high-impedance CV testing with dedicated capacitance compensation paths that reduce distortion in sensitive device measurements.
Easily combine with parameter analyzers and semiconductor device test systems, controlled via intuitive software interfaces for automated switching routines.
| Minimum current measurement resolution | 1 fA to 20 fA |
| Maximum output ports | 10 TΩ to 100 TΩ |
| Matrix, Matrix or Multiplexer |
The E5250A Low-leakage Switch Mainframe provides plug-in modules to integrate CV-IV measurements with an automated measurement system for long-term reliability tests.
6 low-current (triaxial) and 4 general-purpose (coaxial) inputs
| Modular design supports x12, x24, x36,and x48 triaxial output configurations | Triaxial inputs 1 to 4 have dedicated internal paths |
| Triaxial inputs 5 to 6 and the 4 coaxial inputs are multiplexed (3:1) and share 2 internal paths |
6 low-current (triaxial) inputs; 3 dc-bias (coaxial) inputs per card
| Modular design supports x24, x48, x72,and x96 triaxial output configurations | Can gang up to four E5250A mainframes together to support up to 384 output channels |
| The Keysight E5250A low-leakage switch mainframe expands a single measurement station, such as the Keysight B1500A, 4155C, or 4156C, to an automated measurement system. Plug-in modules can be configured either as a cross-point matrix for general parametric measurements or as a multiplexer for long-term reliability measurements. | When configured as a 24 (8 x 3) Channel Multiplexer, the E5250A is ideal for long term reliability measurements with its 384 channel capability and advanced features typically found only on large, more costly input devices. This allows inexpensive power supplies to be used for consistent stressing. |
| The large number of channels and low-cost stress sources allow efficient testing of hundreds of devices in parallel, saving cost and time and achieving accurate, consistent results. |
Two matrix card types supported: E5252A matrix cards and E5255A multiplexer cards
20 femtoamp measurement resolution through the switch using 4156C, B1500A, or E5270B HRSMU
10 x 12 matrix switch for general parametric measurements
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