B1500A
Parameter Analyzers
Keysight B1500A Semiconductor Device Parameter Analyzer is complete device characterization solution supporting versatile measurement capabilities for IV, CV and leading-edge fast pulsed IV measurement with uncompromised measurement reliability.
B1505A
Parameter Analyzers
B1505A Power Device Analyzer / Curve Tracer is a single box solution for power device evaluation from sub-pA to 10 kV & 1500 A. Precise measurement capabilities with 10 µs pulse and µΩ on-resistance measurements.
B2200A
Low-Leakage Switch Matrix
B2200A fA leakage switch mainframe reduces the cost of test by enabling automatic characterization tests without compromising the measurement performance.
B2201A
Low-Leakage Switch Matrix
The Keysight B2201A low leakage switch mainframe reduces the cost of test through characterization test automation.
E5250A
Low-Leakage Switch Matrix
The E5250A Low-leakage Switch Mainframe provides plug-in modules to integrate CV-IV measurements with an automated measurement system for long-term reliability tests.
F9650A
Compact Antenna Test Range
Compact Antenna Test Range (CATR) is optimized to provide the most accurate over-the-air measurements for 5G NR millimeter-wave test.
F9651A
Compact Antenna Test Range
OTA chamber for 5G RF and RRM testing, and antenna system performance characterization at millimeter-wave frequencies.
F9652A
Compact Antenna Test Range
Vertical Compact Antenna Test Range (CATR) to test in-band performance and antenna system characterization.
F9642A
Multi Probe Anechoic Chambers
Protocol and Functional testing at millimeter-wave and sub-6 GHz frequencies.