Q3800A
Electrical Structural Tester
Discover a nondestructive capacitive-based testing solution that accurately identifies defects in wire-bonded microelectronics.
B2981C
Femto / Picoammeters and Electrometers
The B2981C graphical Femto / Picoammeter offers 0.01 fA (0.01 × 10⁻¹⁵ A) resolution for ultra-low current measurements. Its 4.3″ color LCD provides intuitive data visualization with trend charts, histograms, and numeric data for easy analysis.
B2983C
Femto / Picoammeters and Electrometers
The B2983C graphical Femto / Picoammeter offers 0.01 fA (0.01 × 10⁻¹⁵ A) resolution for ultra-low current measurements. Its 4.3″ color LCD provides intuitive data visualization with trend charts and histograms, while battery operation ensures cleaner measurements by eliminating AC noise.
B2985C
Femto / Picoammeters and Electrometers
The B2985C Electrometer / High Resistance Meter offers 0.01 fA (0.01 × 10⁻¹⁵ A) resolution for ultra-low current measurements and measures resistances up to 10 PΩ (10 × 10¹⁵ Ω). Its 4.3” color LCD provides intuitive data visualization with trend charts, histograms, and numeric data.
B2987C
Femto / Picoammeters and Electrometers
The B2987C Electrometer / High Resistance Meter offers 0.01 fA (0.01 × 10⁻¹⁵ A) resolution for ultra-low current measurements and measures resistances up to 10 PΩ (10 × 10¹⁵ Ω). Its 4.3” color LCD provides intuitive data visualization with trend charts, histograms, and numeric data, while battery operation ensures cleaner measurements by eliminating AC noise.
B2200A
Low-Leakage Switch Matrix
B2200A fA leakage switch mainframe reduces the cost of test by enabling automatic characterization tests without compromising the measurement performance.
B2201A
Low-Leakage Switch Matrix
The Keysight B2201A low leakage switch mainframe reduces the cost of test through characterization test automation.
E5250A
Low-Leakage Switch Matrix
The E5250A Low-leakage Switch Mainframe provides plug-in modules to integrate CV-IV measurements with an automated measurement system for long-term reliability tests.