
OB5AP7MA
Isolated Chamber Wireless OTA Testing
The Keysight Octobox Stack-Mid automated testbed delivers multi-location Wi-Fi and 5G testing with expanded STA capacity and MU-MIMO OTA in a stackable anechoic chamber.

OB5AP7SA
Isolated Chamber Wireless OTA Testing
The Keysight Octobox Stack-Min automated testbed provides a stackable anechoic test environment for Wi-Fi and 5G device testing with built-in emulators, attenuators, and automation.

OB5AP7XA
Isolated Chamber Wireless OTA Testing
The Stack-Max is the highest-capacity Octobox testbed for Wi-Fi and 5G testing with tri-band throughput, OFDMA, MU-MIMO OTA, and up to 28 real STAs.
DS2210A
Software
Detect, localize, and mitigate side-channel leakage before tape-out. Inspector SC2 Pre-Silicon Side-Channel Analysis enables hardware security, design, and verification teams to identify side-channel vulnerabilities during design phase and development, before silicon is manufactured (pre-silicon). While traditional post-silicon testing can determine whether leakage exists in a fabricated device, Inspector provides visibility into where leakage originates within the design, helping teams identify the root cause and evaluate mitigation strategies earlier in the development lifecycle. By analyzing register-transfer level (RTL), synthesized netlist, and gate-level designs using simulation test vectors and Value Change Dump (VCD) files, Inspector SC2 Pre-Silicon Side-Channel Analysis identifies which signals leak, how much they leak, when leakage occurs, and where it originates within the design. This visibility enables teams to validate countermeasures, compare design alternatives, and reduce the cost and risk of discovering vulnerabilities after fabrication.

E9902G
In-Circuit Test Systems
The E9902G supports 2592 nodes, Series 6 executes Silicon Nails and Boundary-Scan up to 4x faster, while the overall physical footprint is 16% smaller than before.

E9903G
In-Circuit Test Systems
The E9903G 4-Module In-Circuit Test (ICT) System supports up to 5184 nodes, Series 6 executes digital testing up to 4x faster while the overall physical footprint is 38% smaller.

E9905G
In-Circuit Test Systems
Keysight’s E9905G supports up to 2592 nodes, Series 6 executes digital testing up to 4x faster while the overall physical footprint is 38% smaller.

E9986E
In-Circuit Test Systems
The E9988E Keysight Medalist i3070 Series 5i Inline In-Circuit Test (ICT) system brings ICT technologies into your automated manufacturing line.

E9988E
In-Circuit Test Systems
The E9988E Keysight Medalist i3070 Series 5i Inline In-Circuit Test (ICT) system brings ICT technologies into your automated manufacturing line.