VLB13240A
Fixed Configuration Automation Switches
High-speed Layer 1 automation switch with QSFP-DD interface supporting 1 to 400 GbE for test lab connectivity management.
VLB16400A
Fixed Configuration Automation Switches
High-speed Layer 1 automation switch with QSFP-28 interface supporting 1 to 100 GbE for test lab connectivity management.
CLT11003A2
Automation Optical Switches
MEMS-based optical circuit switch with 320 ports, sub-30 ns latency, and low insertion loss for automated single-mode test lab connectivity.
PLT1008A
Automation Optical Switches
Nonblocking all-optical matrix switches from 8×8 to 384×384 ports with low insertion loss, dark fiber switching, and SDN interfaces for lab or network use.
TLS1011A
Automation Optical Switches
Robotic optical patch panel scaling from 48 to over 10,000 fibers with ultra-low insertion loss and single-mode or multimode fiber support.
E9902G
In-Circuit Test Systems
The E9902G supports 2592 nodes, Series 6 executes Silicon Nails and Boundary-Scan up to 4x faster, while the overall physical footprint is 16% smaller than before.
E9903G
In-Circuit Test Systems
The E9903G 4-Module In-Circuit Test (ICT) System supports up to 5184 nodes, Series 6 executes digital testing up to 4x faster while the overall physical footprint is 38% smaller.
E9905G
In-Circuit Test Systems
Keysight’s E9905G supports up to 2592 nodes, Series 6 executes digital testing up to 4x faster while the overall physical footprint is 38% smaller.
E9986E
In-Circuit Test Systems
The E9988E Keysight Medalist i3070 Series 5i Inline In-Circuit Test (ICT) system brings ICT technologies into your automated manufacturing line.