B1500A
Parameter Analyzers
Keysight B1500A Semiconductor Device Parameter Analyzer is complete device characterization solution supporting versatile measurement capabilities for IV, CV and leading-edge fast pulsed IV measurement with uncompromised measurement reliability.
B1505A
Parameter Analyzers
B1505A Power Device Analyzer / Curve Tracer is a single box solution for power device evaluation from sub-pA to 10 kV & 1500 A. Precise measurement capabilities with 10 µs pulse and µΩ on-resistance measurements.
F9650A
Compact Antenna Test Range
Compact Antenna Test Range (CATR) is optimized to provide the most accurate over-the-air measurements for 5G NR millimeter-wave test.
F9651A
Compact Antenna Test Range
OTA chamber for 5G RF and RRM testing, and antenna system performance characterization at millimeter-wave frequencies.
F9652A
Compact Antenna Test Range
Vertical Compact Antenna Test Range (CATR) to test in-band performance and antenna system characterization.
F9642A
Multi Probe Anechoic Chambers
Protocol and Functional testing at millimeter-wave and sub-6 GHz frequencies.
F9660A
Multi Probe Anechoic Chambers
The F9660A 3D MPAC, integrated with our Network Emulation Solutions, provides OTA measurements with a configurable multi-probe platform for 5G NR mmWave test.
F9640A
Rack-Mountable Test Chambers
Protocol and functional testing in a shielded box at sub-6 GHz and millimeter-wave frequencies
F9641A
Rack-Mountable Test Chambers
Protocol and functional testing in a single-probe anechoic chamber at millimeter-wave frequencies.