930-3365
Functional Interconnect Test Solutions
Advanced Option for the Functional Interconnect Test Solutions GUI for the FITS-8CH chassis. Adds FEC error correction performance measurement and interconnect lane tuning capabilities to the GUI for the FITS-8CH chassis.
941-1020
Functional Interconnect Test Solutions
The Functional Interconnect Test Solutions, model FITS-8CH, includes 2RU benchtop chassis with eight (2×4) High Drive I/O front panel coaxial interface channels and eight (2×4) Chip to Module I/O front panel coaxial interface channels.
B2200A
Low-Leakage Switch Matrix
B2200A fA leakage switch mainframe reduces the cost of test by enabling automatic characterization tests without compromising the measurement performance.
B2201A
Low-Leakage Switch Matrix
The Keysight B2201A low leakage switch mainframe reduces the cost of test through characterization test automation.
E5250A
Low-Leakage Switch Matrix
The E5250A Low-leakage Switch Mainframe provides plug-in modules to integrate CV-IV measurements with an automated measurement system for long-term reliability tests.
F9640A
Rack-Mountable Test Chambers
Protocol and functional testing in a shielded box at sub-6 GHz and millimeter-wave frequencies
F9641A
Rack-Mountable Test Chambers
Protocol and functional testing in a single-probe anechoic chamber at millimeter-wave frequencies.