930-3365
Functional Interconnect Test Solutions
Advanced Option for the Functional Interconnect Test Solutions GUI for the FITS-8CH chassis. Adds FEC error correction performance measurement and interconnect lane tuning capabilities to the GUI for the FITS-8CH chassis.
941-1020
Functional Interconnect Test Solutions
The Functional Interconnect Test Solutions, model FITS-8CH, includes 2RU benchtop chassis with eight (2×4) High Drive I/O front panel coaxial interface channels and eight (2×4) Chip to Module I/O front panel coaxial interface channels.
B2981C
Femto / Picoammeters and Electrometers
The B2981C graphical Femto / Picoammeter offers 0.01 fA (0.01 × 10⁻¹⁵ A) resolution for ultra-low current measurements. Its 4.3″ color LCD provides intuitive data visualization with trend charts, histograms, and numeric data for easy analysis.
B2983C
Femto / Picoammeters and Electrometers
The B2983C graphical Femto / Picoammeter offers 0.01 fA (0.01 × 10⁻¹⁵ A) resolution for ultra-low current measurements. Its 4.3″ color LCD provides intuitive data visualization with trend charts and histograms, while battery operation ensures cleaner measurements by eliminating AC noise.
B2985C
Femto / Picoammeters and Electrometers
The B2985C Electrometer / High Resistance Meter offers 0.01 fA (0.01 × 10⁻¹⁵ A) resolution for ultra-low current measurements and measures resistances up to 10 PΩ (10 × 10¹⁵ Ω). Its 4.3” color LCD provides intuitive data visualization with trend charts, histograms, and numeric data.
B2987C
Femto / Picoammeters and Electrometers
The B2987C Electrometer / High Resistance Meter offers 0.01 fA (0.01 × 10⁻¹⁵ A) resolution for ultra-low current measurements and measures resistances up to 10 PΩ (10 × 10¹⁵ Ω). Its 4.3” color LCD provides intuitive data visualization with trend charts, histograms, and numeric data, while battery operation ensures cleaner measurements by eliminating AC noise.
E9902G
In-Circuit Test Systems
The E9902G supports 2592 nodes, Series 6 executes Silicon Nails and Boundary-Scan up to 4x faster, while the overall physical footprint is 16% smaller than before.
E9903G
In-Circuit Test Systems
The E9903G 4-Module In-Circuit Test (ICT) System supports up to 5184 nodes, Series 6 executes digital testing up to 4x faster while the overall physical footprint is 38% smaller.
E9905G
In-Circuit Test Systems
Keysight’s E9905G supports up to 2592 nodes, Series 6 executes digital testing up to 4x faster while the overall physical footprint is 38% smaller.