
X8712A
IoT Battery Life Solutions
The X8712A IoT Device Battery Life Optimization Solution goes beyond estimating battery runtime. It determines events that are causing battery charge consumption.
DS2210A
Software
Detect, localize, and mitigate side-channel leakage before tape-out. Inspector SC2 Pre-Silicon Side-Channel Analysis enables hardware security, design, and verification teams to identify side-channel vulnerabilities during design phase and development, before silicon is manufactured (pre-silicon). While traditional post-silicon testing can determine whether leakage exists in a fabricated device, Inspector provides visibility into where leakage originates within the design, helping teams identify the root cause and evaluate mitigation strategies earlier in the development lifecycle. By analyzing register-transfer level (RTL), synthesized netlist, and gate-level designs using simulation test vectors and Value Change Dump (VCD) files, Inspector SC2 Pre-Silicon Side-Channel Analysis identifies which signals leak, how much they leak, when leakage occurs, and where it originates within the design. This visibility enables teams to validate countermeasures, compare design alternatives, and reduce the cost and risk of discovering vulnerabilities after fabrication.

F9650A
Compact Antenna Test Range
Compact Antenna Test Range (CATR) is optimized to provide the most accurate over-the-air measurements for 5G NR millimeter-wave test.

F9651A
Compact Antenna Test Range
OTA chamber for 5G RF and RRM testing, and antenna system performance characterization at millimeter-wave frequencies.

F9652A
Compact Antenna Test Range
Vertical Compact Antenna Test Range (CATR) to test in-band performance and antenna system characterization.

F9642A
Multi Probe Anechoic Chambers
Protocol and Functional testing at millimeter-wave and sub-6 GHz frequencies.

F9660A
Multi Probe Anechoic Chambers
The F9660A 3D MPAC, integrated with our Network Emulation Solutions, provides OTA measurements with a configurable multi-probe platform for 5G NR mmWave test.

F9640A
Rack-Mountable Test Chambers
Protocol and functional testing in a shielded box at sub-6 GHz and millimeter-wave frequencies

F9641A
Rack-Mountable Test Chambers
Protocol and functional testing in a single-probe anechoic chamber at millimeter-wave frequencies.