S8702A
RF Development Solutions
RF Automation Toolset provides automated and speed-optimized RF Transmitter and Receiver tests for 5G NR, LTE, WLAN, NB-NTN, NR-NTN and C-V2X based on 3GPP-defined test specifications.
S8714A
RF Development Solutions
Simplify RF verification of 5G NR, LTE, RedCap, NB-NTN, NR-NTN, and Wi-Fi® devices with a solution designed specifically for fast RF testing
LN2C50A045
Device Location Test Solution
Test A-GNSS, OTDOA, ECID, and Wi-Fi positioning on 5G, LTE, and Wi-Fi devices with the 8100 Location Technology Solution for conformance and performance.
LTS1R28U2
Device Location Test Solution
Automated 5G mobile device test system for voice, data, and location performance testing across R&D, operator acceptance, and conformance workflows.
LTS25TP3GP091
Device Location Test Solution
Automated GNSS over-the-air test solutions cover CTIA and CCSA standalone and assisted GNSS OTA requirements for 5G NR, LTE, UMTS, GSM, and CDMA devices.
N9100A
Parametric Test Solutions
The 4080 Series parametric test systems are the industry-standard full parametric test system offering a wide range of measurement capabilities.
NX4881A
Parametric Test Solutions
Keysight 4881HV High Voltage Test System i a breakthrough solution for parametric tests up to 3 kV, supporting high-voltage (HV) and low-voltage (LV) in one-pass tests.
NX5402A
Parametric Test Solutions
NX5402A Silicon Photonics Wafer Test System provides all required features for volume production testing such as WAT or PCM with a fully automated wafer prober.
NX5730A
Parametric Test Solutions
Keysight NX5730A High Throughput 1 ns Pulsed IV Memory Test Solution is designed to perform high-speed pulsed IV and precise DC measurement.