S8701A
Protocol Development Solutions
Comprehensive suite of tools supporting all phases of wireless device development, from pre-silicon protocol module development, through to systems integration and verification
S8713A
Protocol Development Solutions
S8713A Custom Protocol Development Toolset allows users to create tailored 4G/5G control plane protocol signaling serviced by proven 3GPP-compliant L1/L2 layers.
LN2C50A045
Device Location Test Solution
Test A-GNSS, OTDOA, ECID, and Wi-Fi positioning on 5G, LTE, and Wi-Fi devices with the 8100 Location Technology Solution for conformance and performance.
LTS1R28U2
Device Location Test Solution
Automated 5G mobile device test system for voice, data, and location performance testing across R&D, operator acceptance, and conformance workflows.
LTS25TP3GP091
Device Location Test Solution
Automated GNSS over-the-air test solutions cover CTIA and CCSA standalone and assisted GNSS OTA requirements for 5G NR, LTE, UMTS, GSM, and CDMA devices.
N9100A
Parametric Test Solutions
The 4080 Series parametric test systems are the industry-standard full parametric test system offering a wide range of measurement capabilities.
NX4881A
Parametric Test Solutions
Keysight 4881HV High Voltage Test System i a breakthrough solution for parametric tests up to 3 kV, supporting high-voltage (HV) and low-voltage (LV) in one-pass tests.
NX5402A
Parametric Test Solutions
NX5402A Silicon Photonics Wafer Test System provides all required features for volume production testing such as WAT or PCM with a fully automated wafer prober.
NX5730A
Parametric Test Solutions
Keysight NX5730A High Throughput 1 ns Pulsed IV Memory Test Solution is designed to perform high-speed pulsed IV and precise DC measurement.