
LN2C50A045
Device Location Test Solution
Test A-GNSS, OTDOA, ECID, and Wi-Fi positioning on 5G, LTE, and Wi-Fi devices with the 8100 Location Technology Solution for conformance and performance.

LTS1R28U2
Device Location Test Solution
Automated 5G mobile device test system for voice, data, and location performance testing across R&D, operator acceptance, and conformance workflows.

LTS25TP3GP091
Device Location Test Solution
Automated GNSS over-the-air test solutions cover CTIA and CCSA standalone and assisted GNSS OTA requirements for 5G NR, LTE, UMTS, GSM, and CDMA devices.
DS2210A
Software
Detect, localize, and mitigate side-channel leakage before tape-out. Inspector SC2 Pre-Silicon Side-Channel Analysis enables hardware security, design, and verification teams to identify side-channel vulnerabilities during design phase and development, before silicon is manufactured (pre-silicon). While traditional post-silicon testing can determine whether leakage exists in a fabricated device, Inspector provides visibility into where leakage originates within the design, helping teams identify the root cause and evaluate mitigation strategies earlier in the development lifecycle. By analyzing register-transfer level (RTL), synthesized netlist, and gate-level designs using simulation test vectors and Value Change Dump (VCD) files, Inspector SC2 Pre-Silicon Side-Channel Analysis identifies which signals leak, how much they leak, when leakage occurs, and where it originates within the design. This visibility enables teams to validate countermeasures, compare design alternatives, and reduce the cost and risk of discovering vulnerabilities after fabrication.

B1500A
Parameter Analyzers
Keysight B1500A Semiconductor Device Parameter Analyzer is complete device characterization solution supporting versatile measurement capabilities for IV, CV and leading-edge fast pulsed IV measurement with uncompromised measurement reliability.

B1505A
Parameter Analyzers
B1505A Power Device Analyzer / Curve Tracer is a single box solution for power device evaluation from sub-pA to 10 kV & 1500 A. Precise measurement capabilities with 10 µs pulse and µΩ on-resistance measurements.

E5260A
Current-Voltage Analyzers
Keysight E5260A IV Analyzer is the complete solution for current-voltage characterization of a wide range of materials and devices with the current measurement performance as low as 5 pA

E5270B
Current-Voltage Analyzers
Keysight E5270B Precision IV Analyzer is the complete solution for current-voltage characterization of a wide range of materials and devices with the current measurement performance as low as 0.1 fA.
N9100A
Parametric Test Solutions
The 4080 Series parametric test systems are the industry-standard full parametric test system offering a wide range of measurement capabilities.