LN2CNFV001
Cloud-Native Function Test
Validate 5G cloud-native network function resiliency with automated testing that correlates CNF impairments to service-level KPIs in real time.
LN2CNIB003
Cloud-Native Function Test
Benchmark CPU, memory, storage, and networking performance across Kubernetes clusters to validate infrastructure readiness before CNF deployment.
B1506A
Power Device Analyzer / Curve Tracer
B1506A Power Device Analyzer / Curve Tracer can help to evaluate power device parameters across set operating conditions to improve circuit design performance.
PD1000A
Power Device Analyzer / Curve Tracer
Eliminate design cycles by creating real-world power device models resulting in simulations you can trust.
-semiconductors-by-double-pulse-testing-/Use-Case-Webpage-Hero-Banner-characterize-wide-bandgap-WBG-semiconductors-1600x900.png?wid=1600&fmt=png-alpha&resMode=sharp2&op_sharpen=1)
PD1500A
Power Device Analyzer / Curve Tracer
As an off-the-shelf measurement solution, the PD1500A delivers reliable, repeatable measurements of wide-bandgap semiconductors. The platform ensures user safety and protection of the system’s measurement hardware.
PD1550A
Power Device Analyzer / Curve Tracer
The PD1550A Double Pulse Analyzer / Advance Power Device Analyzer delivers reliable, repeatable measurements of wide band gap double pulse test.
E9902G
In-Circuit Test Systems
The E9902G supports 2592 nodes, Series 6 executes Silicon Nails and Boundary-Scan up to 4x faster, while the overall physical footprint is 16% smaller than before.
E9903G
In-Circuit Test Systems
The E9903G 4-Module In-Circuit Test (ICT) System supports up to 5184 nodes, Series 6 executes digital testing up to 4x faster while the overall physical footprint is 38% smaller.
E9905G
In-Circuit Test Systems
Keysight’s E9905G supports up to 2592 nodes, Series 6 executes digital testing up to 4x faster while the overall physical footprint is 38% smaller.