Q3800A
Electrical Structural Tester
Discover a nondestructive capacitive-based testing solution that accurately identifies defects in wire-bonded microelectronics.
F9640A
Rack-Mountable Test Chambers
Protocol and functional testing in a shielded box at sub-6 GHz and millimeter-wave frequencies
F9641A
Rack-Mountable Test Chambers
Protocol and functional testing in a single-probe anechoic chamber at millimeter-wave frequencies.
S7601A
Antenna Measurement
Perform spherical antenna pattern measurements and phased array calibration with high accuracy and speed.