NTN50046C
Analyze Post-Processing Solution
Nemo Analyze is a powerful desktop-based solution for analyzing field test data, with professional post-processing analysis on test data from cellular networks.
B1500A
Parameter Analyzers
Keysight B1500A Semiconductor Device Parameter Analyzer is complete device characterization solution supporting versatile measurement capabilities for IV, CV and leading-edge fast pulsed IV measurement with uncompromised measurement reliability.
B1505A
Parameter Analyzers
B1505A Power Device Analyzer / Curve Tracer is a single box solution for power device evaluation from sub-pA to 10 kV & 1500 A. Precise measurement capabilities with 10 µs pulse and µΩ on-resistance measurements.
B2200A
Low-Leakage Switch Matrix
B2200A fA leakage switch mainframe reduces the cost of test by enabling automatic characterization tests without compromising the measurement performance.
B2201A
Low-Leakage Switch Matrix
The Keysight B2201A low leakage switch mainframe reduces the cost of test through characterization test automation.
E5250A
Low-Leakage Switch Matrix
The E5250A Low-leakage Switch Mainframe provides plug-in modules to integrate CV-IV measurements with an automated measurement system for long-term reliability tests.