
AV1000A
V2X Lab Emulation
Learn about WaveBee Hive, a compact HiL V2X test system and multistack environment for complex simulations in the automotive environment.

AV1001A
V2X Lab Emulation
Learn about WaveBee Hive Extended, a compact HiL V2X test system and multistack environment for complex simulations in the automotive environment.

AV2001B
V2X Lab Emulation
Validate V2X communication and ADAS software early in the development cycle using Keysight’s Software-in-the-Loop (SiL) test solution—powered by Autonomous Drive Emulation, WaveBee tools, and PathWave Test Automation (TAP).

C8732114A
V2X Lab Emulation
The Keysight V2X Full Layer Testing Solutions provide complete testing coverage for C-V2X and DSRC, from the physical layer to the application layer.
CA8737A
V2X Lab Emulation
CA8737A Protocol Conformance Test Suite for China C-V2X is TAP based solution implementing upper-layer testing of messages BSM, MAP, SPAT, RSI and RSM and verifying correct encoding and decoding of messages, based on YDT3710-2020.
DS2210A
Software
Detect, localize, and mitigate side-channel leakage before tape-out. Inspector SC2 Pre-Silicon Side-Channel Analysis enables hardware security, design, and verification teams to identify side-channel vulnerabilities during design phase and development, before silicon is manufactured (pre-silicon). While traditional post-silicon testing can determine whether leakage exists in a fabricated device, Inspector provides visibility into where leakage originates within the design, helping teams identify the root cause and evaluate mitigation strategies earlier in the development lifecycle. By analyzing register-transfer level (RTL), synthesized netlist, and gate-level designs using simulation test vectors and Value Change Dump (VCD) files, Inspector SC2 Pre-Silicon Side-Channel Analysis identifies which signals leak, how much they leak, when leakage occurs, and where it originates within the design. This visibility enables teams to validate countermeasures, compare design alternatives, and reduce the cost and risk of discovering vulnerabilities after fabrication.

U9401B
Advanced
The U9401B Medalist i1000D ICT system offers per pin programmable digital cards to support boundary scan, serial programming, and VCL/PCF digital testing.

U9403A
Advanced
The U9403A Mini ICT provides full ICT features like VTEP, Boundary Scan, and DUT power control which maximize your test coverage by combining functional tests.
