941-0080
Multirate Test Systems
The Keysight A400GE-QDD, 2-port, 400GE / 200GE / 100GE / 50GE Layer 1 BERT QSFP-QDD test system includes a fixed chassis containing the latest version of the KiOS software.
941-0081
Multirate Test Systems
The Keysight A400GE-QDD four-port, 400GE / 200GE / 100GE / 50GE Layer 1 BERT QSFP-QDD test system includes a fixed chassis containing the latest version of the Keysight KiOS software.
941-0086
Multirate Test Systems
The Keysight G800GE-02 system ensures reliable, high-speed network performance with advanced error detection and correction, comprehensive Layer 1 and Layer 2 testing, and an intuitive interface for streamlined test management.
941-0087
Multirate Test Systems
The Keysight G800GE-02 system ensures high-speed network reliability and efficiency with advanced error detection and correction, versatile connectivity options, and an intuitive interface for streamlined testing and analysis.
941-0088
Multirate Test Systems
The Keysight G800GE system ensures high-speed network reliability and performance through advanced error detection and correction, comprehensive Layer 1 and Layer 2 testing, and an intuitive interface for efficient test management.
941-0089
Multirate Test Systems
The Keysight G800GE system enhances network reliability and performance with advanced error detection and correction, high-speed data testing, and an intuitive interface for efficient test management.
S8701A
Protocol Development Solutions
Comprehensive suite of tools supporting all phases of wireless device development, from pre-silicon protocol module development, through to systems integration and verification
S8713A
Protocol Development Solutions
S8713A Custom Protocol Development Toolset allows users to create tailored 4G/5G control plane protocol signaling serviced by proven 3GPP-compliant L1/L2 layers.
S8702A
RF Development Solutions
RF Automation Toolset provides automated and speed-optimized RF Transmitter and Receiver tests for 5G NR, LTE, WLAN, NB-NTN, NR-NTN and C-V2X based on 3GPP-defined test specifications.