VLB13901A
Modular Automation Switches
The Velocity 3901 is a 1-slot Layer 1 automation switch with up to 96 ports of 10 GbE for managing test lab connectivity and topology.
VLB13903A
Modular Automation Switches
The Velocity 3903 is a 3-slot Layer 1 automation switch with up to 288 ports of 10 GbE, redundant power, and multi-protocol support.
VLB13912A
Modular Automation Switches
The Velocity 3912 is a 12-slot Layer 1 automation switch scaling to 1,152 ports of 10 GbE with redundant power and cross switch links.
N9100A
Parametric Test Solutions
The 4080 Series parametric test systems are the industry-standard full parametric test system offering a wide range of measurement capabilities.
NX4881A
Parametric Test Solutions
Keysight 4881HV High Voltage Test System i a breakthrough solution for parametric tests up to 3 kV, supporting high-voltage (HV) and low-voltage (LV) in one-pass tests.
NX5402A
Parametric Test Solutions
NX5402A Silicon Photonics Wafer Test System provides all required features for volume production testing such as WAT or PCM with a fully automated wafer prober.
NX5730A
Parametric Test Solutions
Keysight NX5730A High Throughput 1 ns Pulsed IV Memory Test Solution is designed to perform high-speed pulsed IV and precise DC measurement.
NX6002A
Parametric Test Solutions
The Keysight PX9002A Parallel Parametric Test System has a unique per-pin parametric test unit with a range of parametric test capabilities such as IV measurement, capacitance measurement, frequency measurement and pulsed measurement. It significantly improves throughput with its powerful per-pin test capabilities and strong parallelization function.
P9001A
Parametric Test Solutions
Keysight P9001A Massively Parallel Parametric Test System for fastest parametric test to accelerate Time-to-Market and lower Cost-of-Test.