VLB13901A
Modular Automation Switches
The Velocity 3901 is a 1-slot Layer 1 automation switch with up to 96 ports of 10 GbE for managing test lab connectivity and topology.
VLB13903A
Modular Automation Switches
The Velocity 3903 is a 3-slot Layer 1 automation switch with up to 288 ports of 10 GbE, redundant power, and multi-protocol support.
VLB13912A
Modular Automation Switches
The Velocity 3912 is a 12-slot Layer 1 automation switch scaling to 1,152 ports of 10 GbE with redundant power and cross switch links.
B1500A
Parameter Analyzers
Keysight B1500A Semiconductor Device Parameter Analyzer is complete device characterization solution supporting versatile measurement capabilities for IV, CV and leading-edge fast pulsed IV measurement with uncompromised measurement reliability.
B1505A
Parameter Analyzers
B1505A Power Device Analyzer / Curve Tracer is a single box solution for power device evaluation from sub-pA to 10 kV & 1500 A. Precise measurement capabilities with 10 µs pulse and µΩ on-resistance measurements.
N9100A
Parametric Test Solutions
The 4080 Series parametric test systems are the industry-standard full parametric test system offering a wide range of measurement capabilities.
NX4881A
Parametric Test Solutions
Keysight 4881HV High Voltage Test System i a breakthrough solution for parametric tests up to 3 kV, supporting high-voltage (HV) and low-voltage (LV) in one-pass tests.
NX5402A
Parametric Test Solutions
NX5402A Silicon Photonics Wafer Test System provides all required features for volume production testing such as WAT or PCM with a fully automated wafer prober.
NX5730A
Parametric Test Solutions
Keysight NX5730A High Throughput 1 ns Pulsed IV Memory Test Solution is designed to perform high-speed pulsed IV and precise DC measurement.