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Advanced Tools for Testing, Measurement, and Industrial Instrumentation

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942-0090

Metronome Timing System

IXIA Metronome Timing System and Metronome Timing Software enabling advanced chassis timing.

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942-0091

Metronome Timing System

The IXIA Metronome Timing System Extender. Requires Metronome Timing System 942-0090. It includes 2 MTS to chassis 6′ cables (942-0095). It is also compatible with the XGS-SD chassis, XGS-SDL chassis, XGS-HSL chassis, AresONE fixed chassis, and Novus ONE PLUS fixed chassis.

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B1500A

Parameter Analyzers

Keysight B1500A Semiconductor Device Parameter Analyzer is complete device characterization solution supporting versatile measurement capabilities for IV, CV and leading-edge fast pulsed IV measurement with uncompromised measurement reliability.

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B1505A

Parameter Analyzers

B1505A Power Device Analyzer / Curve Tracer is a single box solution for power device evaluation from sub-pA to 10 kV & 1500 A. Precise measurement capabilities with 10 µs pulse and µΩ on-resistance measurements.

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N9100A

Parametric Test Solutions

The 4080 Series parametric test systems are the industry-standard full parametric test system offering a wide range of measurement capabilities.

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NX4881A

Parametric Test Solutions

Keysight 4881HV High Voltage Test System i a breakthrough solution for parametric tests up to 3 kV, supporting high-voltage (HV) and low-voltage (LV) in one-pass tests.

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NX5402A

Parametric Test Solutions

NX5402A Silicon Photonics Wafer Test System provides all required features for volume production testing such as WAT or PCM with a fully automated wafer prober.

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NX5730A

Parametric Test Solutions

Keysight NX5730A High Throughput 1 ns Pulsed IV Memory Test Solution is designed to perform high-speed pulsed IV and precise DC measurement.

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NX6002A

Parametric Test Solutions

The Keysight PX9002A Parallel Parametric Test System has a unique per-pin parametric test unit with a range of parametric test capabilities such as IV measurement, capacitance measurement, frequency measurement and pulsed measurement. It significantly improves throughput with its powerful per-pin test capabilities and strong parallelization function.

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