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Advanced Tools for Testing, Measurement, and Industrial Instrumentation

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54 new products found

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941-0063

Novus ONE PLUS

The Keysight Novus ONE PLUS 10GE / 1GE fixed chassis features a dual-PHY configuration with 16 ports for SFP+ and 10GBASE-T RJ45 interfaces and support for 10GE, 1GE, and 100M speeds.

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941-0064

Novus ONE PLUS

The Keysight Novus ONE PLUS 10GE / 1GE fixed chassis features a dual-PHY configuration with eight ports for SFP+ and 10GBASE-T RJ45 interfaces and support for 10GE, 1GE, and 100M speeds.

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941-0065

Novus ONE PLUS

The Keysight Novus ONE PLUS 10GE / 1GE fixed chassis features a dual-PHY configuration with four ports for SFP+ and 10GBASE-T RJ45 interfaces and support for 10GE, 1GE, and 100M speeds.

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941-0066

Novus ONE PLUS

The Keysight Novus ONE PLUS 10GE / 5GE / 2.5GE / 1GE fixed chassis features a dual-PHY configuration with 16 ports for SFP+ and 10GBASE-T RJ45 interfaces and support for 10GE, 5GE, 2.5GE, 1GE, and 100M speeds.

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941-0067

Novus ONE PLUS

The Keysight Novus ONE PLUS 10GE / 5GE / 2.5GE / 1GE fixed chassis features a dual-PHY configuration with eight ports for SFP+ and 10GBASE-T RJ45 interfaces and support for 10GE, 5GE, 2.5GE, 1GE, and 100M speeds.

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941-0068

Novus ONE PLUS

The Keysight Novus ONE PLUS 10GE / 5GE / 2.5GE / 1GE fixed chassis features a dual-PHY configuration with four ports for SFP+ and 10GBASE-T RJ45 interfaces and support for 10GE, 5GE, 2.5GE, 1GE, and 100M speeds.

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B1500A

Parameter Analyzers

Keysight B1500A Semiconductor Device Parameter Analyzer is complete device characterization solution supporting versatile measurement capabilities for IV, CV and leading-edge fast pulsed IV measurement with uncompromised measurement reliability.

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B1505A

Parameter Analyzers

B1505A Power Device Analyzer / Curve Tracer is a single box solution for power device evaluation from sub-pA to 10 kV & 1500 A. Precise measurement capabilities with 10 µs pulse and µΩ on-resistance measurements.

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E5260A

Current-Voltage Analyzers

Keysight E5260A IV Analyzer is the complete solution for current-voltage characterization of a wide range of materials and devices with the current measurement performance as low as 5 pA

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