
941-0080
Multirate Test Systems
The Keysight A400GE-QDD, 2-port, 400GE / 200GE / 100GE / 50GE Layer 1 BERT QSFP-QDD test system includes a fixed chassis containing the latest version of the KiOS software.

941-0081
Multirate Test Systems
The Keysight A400GE-QDD four-port, 400GE / 200GE / 100GE / 50GE Layer 1 BERT QSFP-QDD test system includes a fixed chassis containing the latest version of the Keysight KiOS software.

941-0086
Multirate Test Systems
The Keysight G800GE-02 system ensures reliable, high-speed network performance with advanced error detection and correction, comprehensive Layer 1 and Layer 2 testing, and an intuitive interface for streamlined test management.

941-0087
Multirate Test Systems
The Keysight G800GE-02 system ensures high-speed network reliability and efficiency with advanced error detection and correction, versatile connectivity options, and an intuitive interface for streamlined testing and analysis.

941-0088
Multirate Test Systems
The Keysight G800GE system ensures high-speed network reliability and performance through advanced error detection and correction, comprehensive Layer 1 and Layer 2 testing, and an intuitive interface for efficient test management.

941-0089
Multirate Test Systems
The Keysight G800GE system enhances network reliability and performance with advanced error detection and correction, high-speed data testing, and an intuitive interface for efficient test management.

S8702A
RF Development Solutions
RF Automation Toolset provides automated and speed-optimized RF Transmitter and Receiver tests for 5G NR, LTE, WLAN, NB-NTN, NR-NTN and C-V2X based on 3GPP-defined test specifications.

S8714A
RF Development Solutions
Simplify RF verification of 5G NR, LTE, RedCap, NB-NTN, NR-NTN, and Wi-Fi® devices with a solution designed specifically for fast RF testing

B1500A
Parameter Analyzers
Keysight B1500A Semiconductor Device Parameter Analyzer is complete device characterization solution supporting versatile measurement capabilities for IV, CV and leading-edge fast pulsed IV measurement with uncompromised measurement reliability.