DH0150A
Wireless Compliance Solutions
Simulate real‑world interference with Keysight’s Wireless Coexistence Test Solution—fast, ANSI C63.27‑aligned testing to ensure reliable performance in a noisy RF environment.
IOT0047A
Wireless Compliance Solutions
Regulatory compliance test solution validates the regulatory compliance of unlicensed wireless devices across a range of major standards, such as the ETSI and FCC.
X8749B
Wireless Compliance Solutions
The X8749B signal conditioning test set interconnects test instruments, devices under test (DUT), and companion devices with the IOT0047A regulatory test solution.
X8750A
Wireless Compliance Solutions
The X8750 MIMO power test set performs synchronously triggered MIMO power measurements for up to four transmit chains. It is part of the Keysight IOT0047A regulatory test solution.
OB5AP7MA
Isolated Chamber Wireless OTA Testing
The Keysight Octobox Stack-Mid automated testbed delivers multi-location Wi-Fi and 5G testing with expanded STA capacity and MU-MIMO OTA in a stackable anechoic chamber.
OB5AP7SA
Isolated Chamber Wireless OTA Testing
The Keysight Octobox Stack-Min automated testbed provides a stackable anechoic test environment for Wi-Fi and 5G device testing with built-in emulators, attenuators, and automation.
OB5AP7XA
Isolated Chamber Wireless OTA Testing
The Stack-Max is the highest-capacity Octobox testbed for Wi-Fi and 5G testing with tri-band throughput, OFDMA, MU-MIMO OTA, and up to 28 real STAs.
CY101KCTS
Cyber Training
Keysight Cyber Training Simulator (KCTS) is a complete, turnkey cyber range designed to prepare students for the real challenges employers confront daily.
DS2210A
Software
Detect, localize, and mitigate side-channel leakage before tape-out. Inspector SC2 Pre-Silicon Side-Channel Analysis enables hardware security, design, and verification teams to identify side-channel vulnerabilities during design phase and development, before silicon is manufactured (pre-silicon). While traditional post-silicon testing can determine whether leakage exists in a fabricated device, Inspector provides visibility into where leakage originates within the design, helping teams identify the root cause and evaluate mitigation strategies earlier in the development lifecycle. By analyzing register-transfer level (RTL), synthesized netlist, and gate-level designs using simulation test vectors and Value Change Dump (VCD) files, Inspector SC2 Pre-Silicon Side-Channel Analysis identifies which signals leak, how much they leak, when leakage occurs, and where it originates within the design. This visibility enables teams to validate countermeasures, compare design alternatives, and reduce the cost and risk of discovering vulnerabilities after fabrication.