OB5AP7MA
Isolated Chamber Wireless OTA Testing
The Keysight Octobox Stack-Mid automated testbed delivers multi-location Wi-Fi and 5G testing with expanded STA capacity and MU-MIMO OTA in a stackable anechoic chamber.
OB5AP7SA
Isolated Chamber Wireless OTA Testing
The Keysight Octobox Stack-Min automated testbed provides a stackable anechoic test environment for Wi-Fi and 5G device testing with built-in emulators, attenuators, and automation.
OB5AP7XA
Isolated Chamber Wireless OTA Testing
The Stack-Max is the highest-capacity Octobox testbed for Wi-Fi and 5G testing with tri-band throughput, OFDMA, MU-MIMO OTA, and up to 28 real STAs.
B1500A
Parameter Analyzers
Keysight B1500A Semiconductor Device Parameter Analyzer is complete device characterization solution supporting versatile measurement capabilities for IV, CV and leading-edge fast pulsed IV measurement with uncompromised measurement reliability.
B1505A
Parameter Analyzers
B1505A Power Device Analyzer / Curve Tracer is a single box solution for power device evaluation from sub-pA to 10 kV & 1500 A. Precise measurement capabilities with 10 µs pulse and µΩ on-resistance measurements.
E5260A
Current-Voltage Analyzers
Keysight E5260A IV Analyzer is the complete solution for current-voltage characterization of a wide range of materials and devices with the current measurement performance as low as 5 pA
E5270B
Current-Voltage Analyzers
Keysight E5270B Precision IV Analyzer is the complete solution for current-voltage characterization of a wide range of materials and devices with the current measurement performance as low as 0.1 fA.
N9100A
Parametric Test Solutions
The 4080 Series parametric test systems are the industry-standard full parametric test system offering a wide range of measurement capabilities.
B1506A
Power Device Analyzer / Curve Tracer
B1506A Power Device Analyzer / Curve Tracer can help to evaluate power device parameters across set operating conditions to improve circuit design performance.