S8701A
Protocol Development Solutions
Comprehensive suite of tools supporting all phases of wireless device development, from pre-silicon protocol module development, through to systems integration and verification
S8713A
Protocol Development Solutions
S8713A Custom Protocol Development Toolset allows users to create tailored 4G/5G control plane protocol signaling serviced by proven 3GPP-compliant L1/L2 layers.
IOT8720A
Iot Wireless Test
IOT8700 Series is a complete Over-the-air (OTA) signaling test solution that delivers fast, reliable, and efficient measurements to test massive IoT devices.
IOT8740A
Iot Wireless Test
Over-the-air (OTA) signaling test solution that delivers fast, reliable and efficient measurements to test massive IoT devices.
N9100A
Parametric Test Solutions
The 4080 Series parametric test systems are the industry-standard full parametric test system offering a wide range of measurement capabilities.
NX4881A
Parametric Test Solutions
Keysight 4881HV High Voltage Test System i a breakthrough solution for parametric tests up to 3 kV, supporting high-voltage (HV) and low-voltage (LV) in one-pass tests.
NX5402A
Parametric Test Solutions
NX5402A Silicon Photonics Wafer Test System provides all required features for volume production testing such as WAT or PCM with a fully automated wafer prober.
NX5730A
Parametric Test Solutions
Keysight NX5730A High Throughput 1 ns Pulsed IV Memory Test Solution is designed to perform high-speed pulsed IV and precise DC measurement.
NX6002A
Parametric Test Solutions
The Keysight PX9002A Parallel Parametric Test System has a unique per-pin parametric test unit with a range of parametric test capabilities such as IV measurement, capacitance measurement, frequency measurement and pulsed measurement. It significantly improves throughput with its powerful per-pin test capabilities and strong parallelization function.