X8712A
IoT Battery Life Solutions
The X8712A IoT Device Battery Life Optimization Solution goes beyond estimating battery runtime. It determines events that are causing battery charge consumption.
OB5AP7MA
Isolated Chamber Wireless OTA Testing
The Keysight Octobox Stack-Mid automated testbed delivers multi-location Wi-Fi and 5G testing with expanded STA capacity and MU-MIMO OTA in a stackable anechoic chamber.
OB5AP7SA
Isolated Chamber Wireless OTA Testing
The Keysight Octobox Stack-Min automated testbed provides a stackable anechoic test environment for Wi-Fi and 5G device testing with built-in emulators, attenuators, and automation.
OB5AP7XA
Isolated Chamber Wireless OTA Testing
The Stack-Max is the highest-capacity Octobox testbed for Wi-Fi and 5G testing with tri-band throughput, OFDMA, MU-MIMO OTA, and up to 28 real STAs.
N9100A
Parametric Test Solutions
The 4080 Series parametric test systems are the industry-standard full parametric test system offering a wide range of measurement capabilities.
NX4881A
Parametric Test Solutions
Keysight 4881HV High Voltage Test System i a breakthrough solution for parametric tests up to 3 kV, supporting high-voltage (HV) and low-voltage (LV) in one-pass tests.
NX5402A
Parametric Test Solutions
NX5402A Silicon Photonics Wafer Test System provides all required features for volume production testing such as WAT or PCM with a fully automated wafer prober.
NX5730A
Parametric Test Solutions
Keysight NX5730A High Throughput 1 ns Pulsed IV Memory Test Solution is designed to perform high-speed pulsed IV and precise DC measurement.
NX6002A
Parametric Test Solutions
The Keysight PX9002A Parallel Parametric Test System has a unique per-pin parametric test unit with a range of parametric test capabilities such as IV measurement, capacitance measurement, frequency measurement and pulsed measurement. It significantly improves throughput with its powerful per-pin test capabilities and strong parallelization function.