930-3365
Functional Interconnect Test Solutions
Advanced Option for the Functional Interconnect Test Solutions GUI for the FITS-8CH chassis. Adds FEC error correction performance measurement and interconnect lane tuning capabilities to the GUI for the FITS-8CH chassis.
941-1020
Functional Interconnect Test Solutions
The Functional Interconnect Test Solutions, model FITS-8CH, includes 2RU benchtop chassis with eight (2×4) High Drive I/O front panel coaxial interface channels and eight (2×4) Chip to Module I/O front panel coaxial interface channels.
AV1000A
V2X Lab Emulation
Learn about WaveBee Hive, a compact HiL V2X test system and multistack environment for complex simulations in the automotive environment.
AV1001A
V2X Lab Emulation
Learn about WaveBee Hive Extended, a compact HiL V2X test system and multistack environment for complex simulations in the automotive environment.
AV2001B
V2X Lab Emulation
Validate V2X communication and ADAS software early in the development cycle using Keysight’s Software-in-the-Loop (SiL) test solution—powered by Autonomous Drive Emulation, WaveBee tools, and PathWave Test Automation (TAP).
C8732114A
V2X Lab Emulation
The Keysight V2X Full Layer Testing Solutions provide complete testing coverage for C-V2X and DSRC, from the physical layer to the application layer.
CA8737A
V2X Lab Emulation
CA8737A Protocol Conformance Test Suite for China C-V2X is TAP based solution implementing upper-layer testing of messages BSM, MAP, SPAT, RSI and RSM and verifying correct encoding and decoding of messages, based on YDT3710-2020.
U9401B
Advanced
The U9401B Medalist i1000D ICT system offers per pin programmable digital cards to support boundary scan, serial programming, and VCL/PCF digital testing.