952-1001
KAI Inference Builder
The KAI Inference Builder Bundle includes two agents and up to 100 prompts per second (1-year subscription, floating worldwide). The bundle is TAA Compliant.
952-1010
KAI Inference Builder
The KAI Inference Builder Bundle includes 10 agents and up to 1000 prompts per second (1-year subscription, floating worldwide). The bundle is TAA Compliant.
952-1100
KAI Inference Builder
The KAI Inference Builder Bundle includes 10 agents and up to 10,000 prompts per second (1-year subscription, floating worldwide). The bundle is TAA Compliant (952-1100).
930-3365
Functional Interconnect Test Solutions
Advanced Option for the Functional Interconnect Test Solutions GUI for the FITS-8CH chassis. Adds FEC error correction performance measurement and interconnect lane tuning capabilities to the GUI for the FITS-8CH chassis.
941-1020
Functional Interconnect Test Solutions
The Functional Interconnect Test Solutions, model FITS-8CH, includes 2RU benchtop chassis with eight (2×4) High Drive I/O front panel coaxial interface channels and eight (2×4) Chip to Module I/O front panel coaxial interface channels.
N9100A
Parametric Test Solutions
The 4080 Series parametric test systems are the industry-standard full parametric test system offering a wide range of measurement capabilities.
NX4881A
Parametric Test Solutions
Keysight 4881HV High Voltage Test System i a breakthrough solution for parametric tests up to 3 kV, supporting high-voltage (HV) and low-voltage (LV) in one-pass tests.
NX5402A
Parametric Test Solutions
NX5402A Silicon Photonics Wafer Test System provides all required features for volume production testing such as WAT or PCM with a fully automated wafer prober.
NX5730A
Parametric Test Solutions
Keysight NX5730A High Throughput 1 ns Pulsed IV Memory Test Solution is designed to perform high-speed pulsed IV and precise DC measurement.