AT1000L
Full Vehicle OTA Testing
AT1000L Automotive OTA measurement sub-system for SISO/MIMO antennas, passive and active test (TRP/TIS/EIS/EIRP) for reliable automotive connectivity.
B1500A
Parameter Analyzers
Keysight B1500A Semiconductor Device Parameter Analyzer is complete device characterization solution supporting versatile measurement capabilities for IV, CV and leading-edge fast pulsed IV measurement with uncompromised measurement reliability.
B1505A
Parameter Analyzers
B1505A Power Device Analyzer / Curve Tracer is a single box solution for power device evaluation from sub-pA to 10 kV & 1500 A. Precise measurement capabilities with 10 µs pulse and µΩ on-resistance measurements.
E5260A
Current-Voltage Analyzers
Keysight E5260A IV Analyzer is the complete solution for current-voltage characterization of a wide range of materials and devices with the current measurement performance as low as 5 pA
E5270B
Current-Voltage Analyzers
Keysight E5270B Precision IV Analyzer is the complete solution for current-voltage characterization of a wide range of materials and devices with the current measurement performance as low as 0.1 fA.
N9100A
Parametric Test Solutions
The 4080 Series parametric test systems are the industry-standard full parametric test system offering a wide range of measurement capabilities.
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PD1500A
Power Device Analyzer / Curve Tracer
As an off-the-shelf measurement solution, the PD1500A delivers reliable, repeatable measurements of wide-bandgap semiconductors. The platform ensures user safety and protection of the system’s measurement hardware.
PD1550A
Power Device Analyzer / Curve Tracer
The PD1550A Double Pulse Analyzer / Advance Power Device Analyzer delivers reliable, repeatable measurements of wide band gap double pulse test.
B2981C
Femto / Picoammeters and Electrometers
The B2981C graphical Femto / Picoammeter offers 0.01 fA (0.01 × 10⁻¹⁵ A) resolution for ultra-low current measurements. Its 4.3″ color LCD provides intuitive data visualization with trend charts, histograms, and numeric data for easy analysis.