Products

Products

Advanced Tools for Testing, Measurement, and Industrial Instrumentation

Filter Products

Filter Products

5 new products found

Product Type
Product Categories

Sort by:

Product Image

VLB13240A

Fixed Configuration Automation Switches

High-speed Layer 1 automation switch with QSFP-DD interface supporting 1 to 400 GbE for test lab connectivity management.

Product Image

VLB16400A

Fixed Configuration Automation Switches

High-speed Layer 1 automation switch with QSFP-28 interface supporting 1 to 100 GbE for test lab connectivity management.

Product Image

DS2210A

Software

Detect, localize, and mitigate side-channel leakage before tape-out. Inspector SC2 Pre-Silicon Side-Channel Analysis enables hardware security, design, and verification teams to identify side-channel vulnerabilities during design phase and development, before silicon is manufactured (pre-silicon). While traditional post-silicon testing can determine whether leakage exists in a fabricated device, Inspector provides visibility into where leakage originates within the design, helping teams identify the root cause and evaluate mitigation strategies earlier in the development lifecycle. By analyzing register-transfer level (RTL), synthesized netlist, and gate-level designs using simulation test vectors and Value Change Dump (VCD) files, Inspector SC2 Pre-Silicon Side-Channel Analysis identifies which signals leak, how much they leak, when leakage occurs, and where it originates within the design. This visibility enables teams to validate countermeasures, compare design alternatives, and reduce the cost and risk of discovering vulnerabilities after fabrication.

Product Image

F9640A

Rack-Mountable Test Chambers

Protocol and functional testing in a shielded box at sub-6 GHz and millimeter-wave frequencies

Product Image

F9641A

Rack-Mountable Test Chambers

Protocol and functional testing in a single-probe anechoic chamber at millimeter-wave frequencies.

Request for quote