
VLB13240A
Fixed Configuration Automation Switches
High-speed Layer 1 automation switch with QSFP-DD interface supporting 1 to 400 GbE for test lab connectivity management.

VLB16400A
Fixed Configuration Automation Switches
High-speed Layer 1 automation switch with QSFP-28 interface supporting 1 to 100 GbE for test lab connectivity management.
DS2210A
Software
Detect, localize, and mitigate side-channel leakage before tape-out. Inspector SC2 Pre-Silicon Side-Channel Analysis enables hardware security, design, and verification teams to identify side-channel vulnerabilities during design phase and development, before silicon is manufactured (pre-silicon). While traditional post-silicon testing can determine whether leakage exists in a fabricated device, Inspector provides visibility into where leakage originates within the design, helping teams identify the root cause and evaluate mitigation strategies earlier in the development lifecycle. By analyzing register-transfer level (RTL), synthesized netlist, and gate-level designs using simulation test vectors and Value Change Dump (VCD) files, Inspector SC2 Pre-Silicon Side-Channel Analysis identifies which signals leak, how much they leak, when leakage occurs, and where it originates within the design. This visibility enables teams to validate countermeasures, compare design alternatives, and reduce the cost and risk of discovering vulnerabilities after fabrication.

F9640A
Rack-Mountable Test Chambers
Protocol and functional testing in a shielded box at sub-6 GHz and millimeter-wave frequencies

F9641A
Rack-Mountable Test Chambers
Protocol and functional testing in a single-probe anechoic chamber at millimeter-wave frequencies.