941-0080
Multirate Test Systems
The Keysight A400GE-QDD, 2-port, 400GE / 200GE / 100GE / 50GE Layer 1 BERT QSFP-QDD test system includes a fixed chassis containing the latest version of the KiOS software.
941-0081
Multirate Test Systems
The Keysight A400GE-QDD four-port, 400GE / 200GE / 100GE / 50GE Layer 1 BERT QSFP-QDD test system includes a fixed chassis containing the latest version of the Keysight KiOS software.
941-0086
Multirate Test Systems
The Keysight G800GE-02 system ensures reliable, high-speed network performance with advanced error detection and correction, comprehensive Layer 1 and Layer 2 testing, and an intuitive interface for streamlined test management.
941-0087
Multirate Test Systems
The Keysight G800GE-02 system ensures high-speed network reliability and efficiency with advanced error detection and correction, versatile connectivity options, and an intuitive interface for streamlined testing and analysis.
941-0088
Multirate Test Systems
The Keysight G800GE system ensures high-speed network reliability and performance through advanced error detection and correction, comprehensive Layer 1 and Layer 2 testing, and an intuitive interface for efficient test management.
941-0089
Multirate Test Systems
The Keysight G800GE system enhances network reliability and performance with advanced error detection and correction, high-speed data testing, and an intuitive interface for efficient test management.
DS2210A
Software
Detect, localize, and mitigate side-channel leakage before tape-out. Inspector SC2 Pre-Silicon Side-Channel Analysis enables hardware security, design, and verification teams to identify side-channel vulnerabilities during design phase and development, before silicon is manufactured (pre-silicon). While traditional post-silicon testing can determine whether leakage exists in a fabricated device, Inspector provides visibility into where leakage originates within the design, helping teams identify the root cause and evaluate mitigation strategies earlier in the development lifecycle. By analyzing register-transfer level (RTL), synthesized netlist, and gate-level designs using simulation test vectors and Value Change Dump (VCD) files, Inspector SC2 Pre-Silicon Side-Channel Analysis identifies which signals leak, how much they leak, when leakage occurs, and where it originates within the design. This visibility enables teams to validate countermeasures, compare design alternatives, and reduce the cost and risk of discovering vulnerabilities after fabrication.
B2981C
Femto / Picoammeters and Electrometers
The B2981C graphical Femto / Picoammeter offers 0.01 fA (0.01 × 10⁻¹⁵ A) resolution for ultra-low current measurements. Its 4.3″ color LCD provides intuitive data visualization with trend charts, histograms, and numeric data for easy analysis.
B2983C
Femto / Picoammeters and Electrometers
The B2983C graphical Femto / Picoammeter offers 0.01 fA (0.01 × 10⁻¹⁵ A) resolution for ultra-low current measurements. Its 4.3″ color LCD provides intuitive data visualization with trend charts and histograms, while battery operation ensures cleaner measurements by eliminating AC noise.