941-0093
Interconnect And Network Performance Test
Interconnect and Network Performance Tester, 2-port benchtop chassis with native OSFP800 front panel ports, L1-3 support, Includes all 1x800GE, 2x400GE, 4x200GE, and 8x100GE Ethernet speeds (941-0093).
941-0094
Interconnect And Network Performance Test
Interconnect and Network Performance Tester, 4-port benchtop chassis with native OSFP800 front panel ports, L1-3 support, Includes all 1x800GE, 2x400GE, 4x200GE, and 8x100GE Ethernet speeds (941-0094).
941-0095
Interconnect And Network Performance Test
The Keysight Interconnect and Network Performance Tester, having the model number INPT-1600-2P-OSFP-BT, includes a two-port benchtop chassis with native OSFP1600 front panel ports with L1–3 support.
941-0096
Interconnect And Network Performance Test
The Keysight Interconnect and Network Performance Tester, having the model number INPT-1600-2P-OSFP-RM, includes a two-port half-rackmount chassis with native OSFP1600 front panel ports with L1–3 support.
941-0132
Interconnect And Network Performance Test
The Interconnect and Network Performance Tester 1600GE-C, INPT-1600-C-2P-BT, includes a 2-port benchtop chassis with native OSFP1600 front panel ports and L1-3 testing support.
941-0133
Interconnect And Network Performance Test
The Interconnect and Network Performance Tester 1600GE-C, INPT-1600-C-2P-RM, includes a 2-port half rackmount chassis with native OSFP1600 front panel ports and L1-3 testing support.
930-3365
Functional Interconnect Test Solutions
Advanced Option for the Functional Interconnect Test Solutions GUI for the FITS-8CH chassis. Adds FEC error correction performance measurement and interconnect lane tuning capabilities to the GUI for the FITS-8CH chassis.
941-1020
Functional Interconnect Test Solutions
The Functional Interconnect Test Solutions, model FITS-8CH, includes 2RU benchtop chassis with eight (2×4) High Drive I/O front panel coaxial interface channels and eight (2×4) Chip to Module I/O front panel coaxial interface channels.
DS2210A
Software
Detect, localize, and mitigate side-channel leakage before tape-out. Inspector SC2 Pre-Silicon Side-Channel Analysis enables hardware security, design, and verification teams to identify side-channel vulnerabilities during design phase and development, before silicon is manufactured (pre-silicon). While traditional post-silicon testing can determine whether leakage exists in a fabricated device, Inspector provides visibility into where leakage originates within the design, helping teams identify the root cause and evaluate mitigation strategies earlier in the development lifecycle. By analyzing register-transfer level (RTL), synthesized netlist, and gate-level designs using simulation test vectors and Value Change Dump (VCD) files, Inspector SC2 Pre-Silicon Side-Channel Analysis identifies which signals leak, how much they leak, when leakage occurs, and where it originates within the design. This visibility enables teams to validate countermeasures, compare design alternatives, and reduce the cost and risk of discovering vulnerabilities after fabrication.