
B1500A
Parameter Analyzers
Keysight B1500A Semiconductor Device Parameter Analyzer is complete device characterization solution supporting versatile measurement capabilities for IV, CV and leading-edge fast pulsed IV measurement with uncompromised measurement reliability.

B1505A
Parameter Analyzers
B1505A Power Device Analyzer / Curve Tracer is a single box solution for power device evaluation from sub-pA to 10 kV & 1500 A. Precise measurement capabilities with 10 µs pulse and µΩ on-resistance measurements.

B2981C
Femto / Picoammeters and Electrometers
The B2981C graphical Femto / Picoammeter offers 0.01 fA (0.01 × 10⁻¹⁵ A) resolution for ultra-low current measurements. Its 4.3″ color LCD provides intuitive data visualization with trend charts, histograms, and numeric data for easy analysis.

B2983C
Femto / Picoammeters and Electrometers
The B2983C graphical Femto / Picoammeter offers 0.01 fA (0.01 × 10⁻¹⁵ A) resolution for ultra-low current measurements. Its 4.3″ color LCD provides intuitive data visualization with trend charts and histograms, while battery operation ensures cleaner measurements by eliminating AC noise.

B2985C
Femto / Picoammeters and Electrometers
The B2985C Electrometer / High Resistance Meter offers 0.01 fA (0.01 × 10⁻¹⁵ A) resolution for ultra-low current measurements and measures resistances up to 10 PΩ (10 × 10¹⁵ Ω). Its 4.3” color LCD provides intuitive data visualization with trend charts, histograms, and numeric data.

B2987C
Femto / Picoammeters and Electrometers
The B2987C Electrometer / High Resistance Meter offers 0.01 fA (0.01 × 10⁻¹⁵ A) resolution for ultra-low current measurements and measures resistances up to 10 PΩ (10 × 10¹⁵ Ω). Its 4.3” color LCD provides intuitive data visualization with trend charts, histograms, and numeric data, while battery operation ensures cleaner measurements by eliminating AC noise.

Q3000A
Expert
The Keysight i7090 is a scalable, massively parallel test system with up to 20 cores, designed for high-volume, high-mix production, delivering optimized test coverage and take time.