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Advanced Tools for Testing, Measurement, and Industrial Instrumentation

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11 new products found

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OB5AP7MA

Isolated Chamber Wireless OTA Testing

The Keysight Octobox Stack-Mid automated testbed delivers multi-location Wi-Fi and 5G testing with expanded STA capacity and MU-MIMO OTA in a stackable anechoic chamber.

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OB5AP7SA

Isolated Chamber Wireless OTA Testing

The Keysight Octobox Stack-Min automated testbed provides a stackable anechoic test environment for Wi-Fi and 5G device testing with built-in emulators, attenuators, and automation.

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OB5AP7XA

Isolated Chamber Wireless OTA Testing

The Stack-Max is the highest-capacity Octobox testbed for Wi-Fi and 5G testing with tri-band throughput, OFDMA, MU-MIMO OTA, and up to 28 real STAs.

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DS2210A

Software

Detect, localize, and mitigate side-channel leakage before tape-out. Inspector SC2 Pre-Silicon Side-Channel Analysis enables hardware security, design, and verification teams to identify side-channel vulnerabilities during design phase and development, before silicon is manufactured (pre-silicon). While traditional post-silicon testing can determine whether leakage exists in a fabricated device, Inspector provides visibility into where leakage originates within the design, helping teams identify the root cause and evaluate mitigation strategies earlier in the development lifecycle. By analyzing register-transfer level (RTL), synthesized netlist, and gate-level designs using simulation test vectors and Value Change Dump (VCD) files, Inspector SC2 Pre-Silicon Side-Channel Analysis identifies which signals leak, how much they leak, when leakage occurs, and where it originates within the design. This visibility enables teams to validate countermeasures, compare design alternatives, and reduce the cost and risk of discovering vulnerabilities after fabrication.

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N9100A

Parametric Test Solutions

The 4080 Series parametric test systems are the industry-standard full parametric test system offering a wide range of measurement capabilities.

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NX4881A

Parametric Test Solutions

Keysight 4881HV High Voltage Test System i a breakthrough solution for parametric tests up to 3 kV, supporting high-voltage (HV) and low-voltage (LV) in one-pass tests.

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NX5402A

Parametric Test Solutions

NX5402A Silicon Photonics Wafer Test System provides all required features for volume production testing such as WAT or PCM with a fully automated wafer prober.

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NX5730A

Parametric Test Solutions

Keysight NX5730A High Throughput 1 ns Pulsed IV Memory Test Solution is designed to perform high-speed pulsed IV and precise DC measurement.

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NX6002A

Parametric Test Solutions

The Keysight PX9002A Parallel Parametric Test System has a unique per-pin parametric test unit with a range of parametric test capabilities such as IV measurement, capacitance measurement, frequency measurement and pulsed measurement. It significantly improves throughput with its powerful per-pin test capabilities and strong parallelization function.

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