941-0063
Novus ONE PLUS
The Keysight Novus ONE PLUS 10GE / 1GE fixed chassis features a dual-PHY configuration with 16 ports for SFP+ and 10GBASE-T RJ45 interfaces and support for 10GE, 1GE, and 100M speeds.
941-0064
Novus ONE PLUS
The Keysight Novus ONE PLUS 10GE / 1GE fixed chassis features a dual-PHY configuration with eight ports for SFP+ and 10GBASE-T RJ45 interfaces and support for 10GE, 1GE, and 100M speeds.
941-0065
Novus ONE PLUS
The Keysight Novus ONE PLUS 10GE / 1GE fixed chassis features a dual-PHY configuration with four ports for SFP+ and 10GBASE-T RJ45 interfaces and support for 10GE, 1GE, and 100M speeds.
941-0066
Novus ONE PLUS
The Keysight Novus ONE PLUS 10GE / 5GE / 2.5GE / 1GE fixed chassis features a dual-PHY configuration with 16 ports for SFP+ and 10GBASE-T RJ45 interfaces and support for 10GE, 5GE, 2.5GE, 1GE, and 100M speeds.
941-0067
Novus ONE PLUS
The Keysight Novus ONE PLUS 10GE / 5GE / 2.5GE / 1GE fixed chassis features a dual-PHY configuration with eight ports for SFP+ and 10GBASE-T RJ45 interfaces and support for 10GE, 5GE, 2.5GE, 1GE, and 100M speeds.
941-0068
Novus ONE PLUS
The Keysight Novus ONE PLUS 10GE / 5GE / 2.5GE / 1GE fixed chassis features a dual-PHY configuration with four ports for SFP+ and 10GBASE-T RJ45 interfaces and support for 10GE, 5GE, 2.5GE, 1GE, and 100M speeds.
930-3365
Functional Interconnect Test Solutions
Advanced Option for the Functional Interconnect Test Solutions GUI for the FITS-8CH chassis. Adds FEC error correction performance measurement and interconnect lane tuning capabilities to the GUI for the FITS-8CH chassis.
941-1020
Functional Interconnect Test Solutions
The Functional Interconnect Test Solutions, model FITS-8CH, includes 2RU benchtop chassis with eight (2×4) High Drive I/O front panel coaxial interface channels and eight (2×4) Chip to Module I/O front panel coaxial interface channels.
DS2210A
Software
Detect, localize, and mitigate side-channel leakage before tape-out. Inspector SC2 Pre-Silicon Side-Channel Analysis enables hardware security, design, and verification teams to identify side-channel vulnerabilities during design phase and development, before silicon is manufactured (pre-silicon). While traditional post-silicon testing can determine whether leakage exists in a fabricated device, Inspector provides visibility into where leakage originates within the design, helping teams identify the root cause and evaluate mitigation strategies earlier in the development lifecycle. By analyzing register-transfer level (RTL), synthesized netlist, and gate-level designs using simulation test vectors and Value Change Dump (VCD) files, Inspector SC2 Pre-Silicon Side-Channel Analysis identifies which signals leak, how much they leak, when leakage occurs, and where it originates within the design. This visibility enables teams to validate countermeasures, compare design alternatives, and reduce the cost and risk of discovering vulnerabilities after fabrication.