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Advanced Tools for Testing, Measurement, and Industrial Instrumentation

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14 new products found

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930-3365

Functional Interconnect Test Solutions

Advanced Option for the Functional Interconnect Test Solutions GUI for the FITS-8CH chassis. Adds FEC error correction performance measurement and interconnect lane tuning capabilities to the GUI for the FITS-8CH chassis.

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941-1020

Functional Interconnect Test Solutions

The Functional Interconnect Test Solutions, model FITS-8CH, includes 2RU benchtop chassis with eight (2×4) High Drive I/O front panel coaxial interface channels and eight (2×4) Chip to Module I/O front panel coaxial interface channels.

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SL1041B

DC

The Scienlab Dynamic DC Emulator (DCE) Mid-Power Series provides bi-directional, regenerative DC power supplies for efficient and effective testing of the different power electronic components in EV and EVSE.

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SL1810A

DC

The SL1810A DC Emulator provides source and regenerative sink capabilities at 1000 V, 1200 V, or 1500 V, 300 A, and 100 kW in a compact cabinet.

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SL1820A

DC

The SL1820A provides source and regenerative sink capabilities at 1000 V, 1200 V, or 1500 V, 300 A, and 100 kW in a cabinet that can be upgraded to 200 kW or 300 kW.

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SL1830A

DC

The SL1830A DC Emulator provides source and regenerative sink capabilities at 1000 V, 1200 V, or 1500 V, 300 A or 600 A, and 200 kW that can be upgraded to 300 kW.

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SL1840A

DC

The Keysight SL1840A provides source and regenerative sink capabilities at 1000 V, 1200 V, or 1500 V, 300 A, 600 A, or 900 A, and 300 kW.

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CY101KCTS

Cyber Training

Keysight Cyber Training Simulator (KCTS) is a complete, turnkey cyber range designed to prepare students for the real challenges employers confront daily.

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DS2210A

Software

Detect, localize, and mitigate side-channel leakage before tape-out. Inspector SC2 Pre-Silicon Side-Channel Analysis enables hardware security, design, and verification teams to identify side-channel vulnerabilities during design phase and development, before silicon is manufactured (pre-silicon). While traditional post-silicon testing can determine whether leakage exists in a fabricated device, Inspector provides visibility into where leakage originates within the design, helping teams identify the root cause and evaluate mitigation strategies earlier in the development lifecycle. By analyzing register-transfer level (RTL), synthesized netlist, and gate-level designs using simulation test vectors and Value Change Dump (VCD) files, Inspector SC2 Pre-Silicon Side-Channel Analysis identifies which signals leak, how much they leak, when leakage occurs, and where it originates within the design. This visibility enables teams to validate countermeasures, compare design alternatives, and reduce the cost and risk of discovering vulnerabilities after fabrication.

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