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Advanced Tools for Testing, Measurement, and Industrial Instrumentation

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930-3365

Functional Interconnect Test Solutions

Advanced Option for the Functional Interconnect Test Solutions GUI for the FITS-8CH chassis. Adds FEC error correction performance measurement and interconnect lane tuning capabilities to the GUI for the FITS-8CH chassis.

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941-1020

Functional Interconnect Test Solutions

The Functional Interconnect Test Solutions, model FITS-8CH, includes 2RU benchtop chassis with eight (2×4) High Drive I/O front panel coaxial interface channels and eight (2×4) Chip to Module I/O front panel coaxial interface channels.

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LN2CNFV001

Cloud-Native Function Test

Validate 5G cloud-native network function resiliency with automated testing that correlates CNF impairments to service-level KPIs in real time.

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LN2CNIB003

Cloud-Native Function Test

Benchmark CPU, memory, storage, and networking performance across Kubernetes clusters to validate infrastructure readiness before CNF deployment.

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N9100A

Parametric Test Solutions

The 4080 Series parametric test systems are the industry-standard full parametric test system offering a wide range of measurement capabilities.

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NX4881A

Parametric Test Solutions

Keysight 4881HV High Voltage Test System i a breakthrough solution for parametric tests up to 3 kV, supporting high-voltage (HV) and low-voltage (LV) in one-pass tests.

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NX5402A

Parametric Test Solutions

NX5402A Silicon Photonics Wafer Test System provides all required features for volume production testing such as WAT or PCM with a fully automated wafer prober.

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NX5730A

Parametric Test Solutions

Keysight NX5730A High Throughput 1 ns Pulsed IV Memory Test Solution is designed to perform high-speed pulsed IV and precise DC measurement.

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NX6002A

Parametric Test Solutions

The Keysight PX9002A Parallel Parametric Test System has a unique per-pin parametric test unit with a range of parametric test capabilities such as IV measurement, capacitance measurement, frequency measurement and pulsed measurement. It significantly improves throughput with its powerful per-pin test capabilities and strong parallelization function.

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