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Advanced Tools for Testing, Measurement, and Industrial Instrumentation

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18 new products found

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941-0080

Multirate Test Systems

The Keysight A400GE-QDD, 2-port, 400GE / 200GE / 100GE / 50GE Layer 1 BERT QSFP-QDD test system includes a fixed chassis containing the latest version of the KiOS software.

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941-0081

Multirate Test Systems

The Keysight A400GE-QDD four-port, 400GE / 200GE / 100GE / 50GE Layer 1 BERT QSFP-QDD test system includes a fixed chassis containing the latest version of the Keysight KiOS software.

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941-0086

Multirate Test Systems

The Keysight G800GE-02 system ensures reliable, high-speed network performance with advanced error detection and correction, comprehensive Layer 1 and Layer 2 testing, and an intuitive interface for streamlined test management.

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941-0087

Multirate Test Systems

The Keysight G800GE-02 system ensures high-speed network reliability and efficiency with advanced error detection and correction, versatile connectivity options, and an intuitive interface for streamlined testing and analysis.

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941-0088

Multirate Test Systems

The Keysight G800GE system ensures high-speed network reliability and performance through advanced error detection and correction, comprehensive Layer 1 and Layer 2 testing, and an intuitive interface for efficient test management.

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941-0089

Multirate Test Systems

The Keysight G800GE system enhances network reliability and performance with advanced error detection and correction, high-speed data testing, and an intuitive interface for efficient test management.

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S8709A

Cellular Virtual Drive Test Emulation

S8709A Virtual Drive Test Toolset is a real-world lab test validating 5G devices under a wide range of network signaling and radio channel conditions.

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E2011GC

Functional Test Systems

TestExec SL is a highly flexible test executive software for electronics manufacturing functional test applications in multiple industries.

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U8972A

Functional Test Systems

The TS-5400 PXI functional Test System with Mac panel interface that supports up to 464 test nodes for testing electronics control modules via multi-DUT test.

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