CLT11003A2
Automation Optical Switches
MEMS-based optical circuit switch with 320 ports, sub-30 ns latency, and low insertion loss for automated single-mode test lab connectivity.
PLT1008A
Automation Optical Switches
Nonblocking all-optical matrix switches from 8×8 to 384×384 ports with low insertion loss, dark fiber switching, and SDN interfaces for lab or network use.
TLS1011A
Automation Optical Switches
Robotic optical patch panel scaling from 48 to over 10,000 fibers with ultra-low insertion loss and single-mode or multimode fiber support.
S8701A
Protocol Development Solutions
Comprehensive suite of tools supporting all phases of wireless device development, from pre-silicon protocol module development, through to systems integration and verification
S8713A
Protocol Development Solutions
S8713A Custom Protocol Development Toolset allows users to create tailored 4G/5G control plane protocol signaling serviced by proven 3GPP-compliant L1/L2 layers.
N9100A
Parametric Test Solutions
The 4080 Series parametric test systems are the industry-standard full parametric test system offering a wide range of measurement capabilities.
NX4881A
Parametric Test Solutions
Keysight 4881HV High Voltage Test System i a breakthrough solution for parametric tests up to 3 kV, supporting high-voltage (HV) and low-voltage (LV) in one-pass tests.
NX5402A
Parametric Test Solutions
NX5402A Silicon Photonics Wafer Test System provides all required features for volume production testing such as WAT or PCM with a fully automated wafer prober.
NX5730A
Parametric Test Solutions
Keysight NX5730A High Throughput 1 ns Pulsed IV Memory Test Solution is designed to perform high-speed pulsed IV and precise DC measurement.