941-0130
AresONE 1600GE
The AresONE 1600GE 4-port rackmount chassis with native OSFP1600 front panel ports, Integrated Heatsink (IHS) optics, and L1-3 testing support includes all 1x1600GE, 2x800GE, 4x400GE, and 8x200GE Ethernet speeds (941-0130).
941-0131
AresONE 1600GE
The AresONE 1600GE 4-port rackmount chassis with native OSFP1600 front panel ports, Riding Heatsink (RHS) optics, and L1-3 testing support includes all 1x1600GE, 2x800GE, 4x400GE, and 8x200GE Ethernet speeds (941-0131).
941-0063
Novus ONE PLUS
The Keysight Novus ONE PLUS 10GE / 1GE fixed chassis features a dual-PHY configuration with 16 ports for SFP+ and 10GBASE-T RJ45 interfaces and support for 10GE, 1GE, and 100M speeds.
941-0064
Novus ONE PLUS
The Keysight Novus ONE PLUS 10GE / 1GE fixed chassis features a dual-PHY configuration with eight ports for SFP+ and 10GBASE-T RJ45 interfaces and support for 10GE, 1GE, and 100M speeds.
941-0065
Novus ONE PLUS
The Keysight Novus ONE PLUS 10GE / 1GE fixed chassis features a dual-PHY configuration with four ports for SFP+ and 10GBASE-T RJ45 interfaces and support for 10GE, 1GE, and 100M speeds.
941-0066
Novus ONE PLUS
The Keysight Novus ONE PLUS 10GE / 5GE / 2.5GE / 1GE fixed chassis features a dual-PHY configuration with 16 ports for SFP+ and 10GBASE-T RJ45 interfaces and support for 10GE, 5GE, 2.5GE, 1GE, and 100M speeds.
941-0067
Novus ONE PLUS
The Keysight Novus ONE PLUS 10GE / 5GE / 2.5GE / 1GE fixed chassis features a dual-PHY configuration with eight ports for SFP+ and 10GBASE-T RJ45 interfaces and support for 10GE, 5GE, 2.5GE, 1GE, and 100M speeds.
941-0068
Novus ONE PLUS
The Keysight Novus ONE PLUS 10GE / 5GE / 2.5GE / 1GE fixed chassis features a dual-PHY configuration with four ports for SFP+ and 10GBASE-T RJ45 interfaces and support for 10GE, 5GE, 2.5GE, 1GE, and 100M speeds.
DS2210A
Software
Detect, localize, and mitigate side-channel leakage before tape-out. Inspector SC2 Pre-Silicon Side-Channel Analysis enables hardware security, design, and verification teams to identify side-channel vulnerabilities during design phase and development, before silicon is manufactured (pre-silicon). While traditional post-silicon testing can determine whether leakage exists in a fabricated device, Inspector provides visibility into where leakage originates within the design, helping teams identify the root cause and evaluate mitigation strategies earlier in the development lifecycle. By analyzing register-transfer level (RTL), synthesized netlist, and gate-level designs using simulation test vectors and Value Change Dump (VCD) files, Inspector SC2 Pre-Silicon Side-Channel Analysis identifies which signals leak, how much they leak, when leakage occurs, and where it originates within the design. This visibility enables teams to validate countermeasures, compare design alternatives, and reduce the cost and risk of discovering vulnerabilities after fabrication.