941-0130
AresONE 1600GE
The AresONE 1600GE 4-port rackmount chassis with native OSFP1600 front panel ports, Integrated Heatsink (IHS) optics, and L1-3 testing support includes all 1x1600GE, 2x800GE, 4x400GE, and 8x200GE Ethernet speeds (941-0130).
941-0131
AresONE 1600GE
The AresONE 1600GE 4-port rackmount chassis with native OSFP1600 front panel ports, Riding Heatsink (RHS) optics, and L1-3 testing support includes all 1x1600GE, 2x800GE, 4x400GE, and 8x200GE Ethernet speeds (941-0131).
VLB13901A
Modular Automation Switches
The Velocity 3901 is a 1-slot Layer 1 automation switch with up to 96 ports of 10 GbE for managing test lab connectivity and topology.
VLB13903A
Modular Automation Switches
The Velocity 3903 is a 3-slot Layer 1 automation switch with up to 288 ports of 10 GbE, redundant power, and multi-protocol support.
VLB13912A
Modular Automation Switches
The Velocity 3912 is a 12-slot Layer 1 automation switch scaling to 1,152 ports of 10 GbE with redundant power and cross switch links.
N9100A
Parametric Test Solutions
The 4080 Series parametric test systems are the industry-standard full parametric test system offering a wide range of measurement capabilities.
NX4881A
Parametric Test Solutions
Keysight 4881HV High Voltage Test System i a breakthrough solution for parametric tests up to 3 kV, supporting high-voltage (HV) and low-voltage (LV) in one-pass tests.
NX5402A
Parametric Test Solutions
NX5402A Silicon Photonics Wafer Test System provides all required features for volume production testing such as WAT or PCM with a fully automated wafer prober.
NX5730A
Parametric Test Solutions
Keysight NX5730A High Throughput 1 ns Pulsed IV Memory Test Solution is designed to perform high-speed pulsed IV and precise DC measurement.