941-0130
AresONE 1600GE
The AresONE 1600GE 4-port rackmount chassis with native OSFP1600 front panel ports, Integrated Heatsink (IHS) optics, and L1-3 testing support includes all 1x1600GE, 2x800GE, 4x400GE, and 8x200GE Ethernet speeds (941-0130).
941-0131
AresONE 1600GE
The AresONE 1600GE 4-port rackmount chassis with native OSFP1600 front panel ports, Riding Heatsink (RHS) optics, and L1-3 testing support includes all 1x1600GE, 2x800GE, 4x400GE, and 8x200GE Ethernet speeds (941-0131).
941-0080
Multirate Test Systems
The Keysight A400GE-QDD, 2-port, 400GE / 200GE / 100GE / 50GE Layer 1 BERT QSFP-QDD test system includes a fixed chassis containing the latest version of the KiOS software.
941-0081
Multirate Test Systems
The Keysight A400GE-QDD four-port, 400GE / 200GE / 100GE / 50GE Layer 1 BERT QSFP-QDD test system includes a fixed chassis containing the latest version of the Keysight KiOS software.
941-0086
Multirate Test Systems
The Keysight G800GE-02 system ensures reliable, high-speed network performance with advanced error detection and correction, comprehensive Layer 1 and Layer 2 testing, and an intuitive interface for streamlined test management.
941-0087
Multirate Test Systems
The Keysight G800GE-02 system ensures high-speed network reliability and efficiency with advanced error detection and correction, versatile connectivity options, and an intuitive interface for streamlined testing and analysis.
941-0088
Multirate Test Systems
The Keysight G800GE system ensures high-speed network reliability and performance through advanced error detection and correction, comprehensive Layer 1 and Layer 2 testing, and an intuitive interface for efficient test management.
941-0089
Multirate Test Systems
The Keysight G800GE system enhances network reliability and performance with advanced error detection and correction, high-speed data testing, and an intuitive interface for efficient test management.
U9401B
Advanced
The U9401B Medalist i1000D ICT system offers per pin programmable digital cards to support boundary scan, serial programming, and VCL/PCF digital testing.