Dynamic Power Device Analyzer/Double Pulse Tester
Reliable, repeatable measurement of wide-bandgap (SiC, GaN) power semiconductor dynamic characteristics. Characteristics measured include, turn-on, turn-off, switching, reverse recovery, gate charge, and many others. Sate test environment for both the DUT and the user. Expandable, upgradeable, modular platform enables testing of all power devices. As an off-the-shelf measurement solution, the PD1500A delivers reliable, repeatable measurements […]