P9002A parallel parametric test system is an addition to Keysight P9000 Series parallel parametric tester with flexible license-based configuration.
| Maximum number of measurement pins | 100 |
| Minimum voltage measurement resolution | 2 µV |
| Additional features | SPGU output, CV measurement |
| Minimum current measurement resolution | 0.1 fA |
| View Technical Specification |
Increase test efficiency with multi-site capabilities and fast, programmable switching, ideal for use in volume wafer probing or high-mix packaged device environments.
Seamlessly combine precision SMUs, capacitance measurement units, pulse modules, and reliability tools within one scalable system to suit a wide range of test scenarios.
Perform comprehensive parametric, pulsed IV, and long-duration stress measurements to support device qualification and monitor reliability across different operating regimes.
Leverage modular software platforms to tailor test sequences and automation scripts for production, modeling, or exploratory device research.
P9002A parallel parametric test system is an addition to Keysight P9000 Series parallel parametric tester with flexible license-based configuration.
P9002A parallel parametric test system is an addition to Keysight P9000 Series parallel parametric tester with flexible license-based configuration.
| Maximum number of measurement pins | 100 |
| Minimum voltage measurement resolution | 2 µV |
| Additional features | SPGU output, CV measurement |
| Minimum current measurement resolution | 0.1 fA |
| View Technical Specification |
Provides the best return on parametric test investment for all evolving semiconductor manufacturers by meeting all test demands from Keysight 4080 Series serial parametric test to P9001A per-pin parallel parametric test and everything in between.
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