Use a high-speed SMU that enables dynamic / pulsed measurements. Achieve narrow pulse measurements down to 50 μs at a fast sampling rate of up to 1 MSa/s for a wide range of emerging applications.
Use a high-speed SMU that enables dynamic / pulsed measurements. Achieve narrow pulse measurements down to 50 μs at a fast sampling rate of up to 1 MSa/s for a wide range of emerging applications.
| Maximum current per output | 3.5 A |
| Maximum voltage per output | 60 V |
| Number of outputs | N/A |
| Maximum output current | 3.0 A DC / 10.5 A pulse |
| Platform | PZ2100A Mainframe |
| Auxiliary Voltage Measurement Input | No |
| Maximum power | N/A |
| Type | High-Speed Precision SMU |
| Minimum Pulse Width | 50 µs |
| Minimum current measurement resolution | 100 fA |
| Maximum sample rate | 1 MSa/s |
Use a high-speed SMU that enables dynamic / pulsed measurements. Achieve narrow pulse measurements down to 50 μs at a fast sampling rate of up to 1 MSa/s for a wide range of emerging applications.
Use a high-speed SMU that enables dynamic / pulsed measurements. Achieve narrow pulse measurements down to 50 μs at a fast sampling rate of up to 1 MSa/s for a wide range of emerging applications.
| Maximum current per output | 3.5 A |
| Maximum voltage per output | 60 V |
| Number of outputs | N/A |
| Maximum output current | 3.0 A DC / 10.5 A pulse |
| Platform | PZ2100A Mainframe |
| Auxiliary Voltage Measurement Input | No |
| Maximum power | N/A |
| Type | High-Speed Precision SMU |
| Minimum Pulse Width | 50 µs |
| Minimum current measurement resolution | 100 fA |
| Maximum sample rate | 1 MSa/s |
The Keysight PZ2120A is a cost-effective, high-speed precision source / measure unit (SMU) featuring best narrow pulse width, fast Digitizer Mode, and seamless current measurement ranging. It enables narrow-pulsed measurements and fast dynamic measurements with a wide dynamic range for a wide range of emerging applications such as vertical-cavity surface-emitting laser (VCSEL) optical devices and integrated circuit (IC) testing. In addition, its low measurement noise performance enables measurements with shorter aperture times, and its seamless current measurement ranging function enables a wide dynamic range and eliminates range change time, which improves test throughput.
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