Probe signals with a considerable amount of test points in tight spaces, such as a DDR memory system.

Extend your ZIF tip connection up to 11 mm with this economical, solder-in probe solution; set includes 10 ZIF tips.

The best solution to easily and accurately probe small devices using the fully-integrated flexible micro probe head.

The best solution to easily and accurately probe small devices using the fully-integrated flexible micro probe head.

The best solution to easily and accurately probe small devices using the fully-integrated flexible micro probe head.

The best solution to easily and accurately probe small devices using the fully-integrated flexible micro probe head.

Measure larger signals with faster edges by increasing the dynamic range and offset range of the probe system.

Connects magnetically to the matching probe head for a quick and secure connection; includes four tips.

Uses magnets to provide quick connect/disconnect when probing multiple high-speed test points.