Minimize circuit loading with a differential input resistance of 1.7 MΩ and a low input capacitance of 1.5 pF.

Minimize circuit loading with a differential input resistance of 1.7 MΩ and a low input capacitance of 1.5 pF

Remove any residual magnetism and unwanted DC offset in the probe with auto demagnetization (degauss) and calibration.

Probe signals with a considerable amount of test points in tight spaces, such as a DDR memory system.

Use your active probe (InfiniiMax I, II, or 1156A-58A) or 50 Ω BNC cables with the Infiniium 90000 X-series oscilloscope.

Extend your ZIF tip connection up to 11 mm with this economical, solder-in probe solution; set includes 10 ZIF tips.

Make power integrity measurements that need mV sensitivity when measuring noise, ripple, and transients on DC supplies.

Calibrate and deskew probe amplifiers and verify the performance of the probe using a VNA

Perform probing on high-speed devices with this small, high-performance, reusable probe head.